Abstract

Partial discharge (PD) is one of the key factors leading to premature insulation failure of film capacitors used in pulse power devices. To study the effect of frequency on the PD characteristics of biaxially oriented polypropylene (BOPP) film, a sphere-plate electrode was used to simulate defects of the air gap between the film layers. PD experiments of the BOPP film were carried out under 1, 10, 100, 500 Hz, and 1 kHz with a rising edge of 65 ns and a pulse width of 300 ns. The results show that the repetitive partial discharge inception voltage (RPDIV), the number of discharges, the rising stage discharge (RSD) amplitude, and the falling stage discharge (FSD) time-lag, all show an increase and then decrease with increasing pulse frequencies and reach a maximum value at a pulse frequency of 100 Hz. Moreover, the FSD discharge amplitude and the RSD discharge time-lag increase with an increasing pulse frequency. From the perspective of initial electron generation, the quantitative mathematical relationship between PD characteristics (RPDIV, PD amplitude, PD number, and PD time-lag) and frequency was established based on the Fowler–Nordheim field emission effect for the first time, which can reflect the influence of frequency on the memory effect and the development process of PD. The results can provide an experimental basis and a mechanistic explanation for the evaluation of PD characteristics for film capacitors under nanosecond pulse voltage.

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