Abstract
A method for obtaining analytical expressions for the energy (intensity) optical coefficients and their envelopes of a weakly absorbing film in some cases of partial coherent interaction of rays inside the film due to finite spectral width of the incident light is proposed. The method is demonstrated with the normal incidence transmittivity, front and back reflectivities, front and back absorptivities of a semiconductor absorbing film on a transparent substrate for the cases of rectangular, Lorentzian and Gaussian spectral distributions of light.
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