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Abstract
This paper describes study of light induced degradation (LID) in monocrystalline Czochralsky-wafers p-type substrate solar cells during the different test condition. The intensity of light source was 0.5 -1 sun with 1.5 AM spectrum. The temperature of solar cells was controlled in the range of 15 - 70 °C. The samples of solar cells were chosen from nine sets of solar cells produced by variety technologies and with variety parameters. The life time of charge carriers, VA characteristic, electroluminescence characteristic were set up after phosphor diffusion. After light degradation in variety condition was determined again and compare with starting parameters. The samples were regenerated by high temperature with and without light and parameters were measured again. The whole experiment was analyzed and the correlation was made.
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