Abstract
In this study, copper sulfide (CuS) semiconductor material is combined with a polyvinyl alcohol (PVA) polymer to synthesize a hybrid organic/inorganic thin film, due to their respective intrinsic properties and extensive array of applications in optical and electrical devices. The PVA organic polymer was mixed with three different concentrations of CuS powder (0.002 g, 0.02 g, and 0.2 g), to determine the thickness of emissive layer for light-emitting applications. The structural, morphological, electrical, optical, and photoluminescence (PL) properties of the thin films were examined. The PVA/CuS thin films synthesized from CuS concentration of 0.2 g exhibited the largest grain size (37.3 nm), the highest thickness (17.48 μm), surface roughness (94.6 nm), conductivity (2.8 Ω cm, 7.55 × 103 cm2/V s, and 1.48 × 1014/cm3), the lowest bandgap (3.59 eV) and the strongest emission bands. Thus, concentration of the precursor CuS material influences the structural, morphological, electrical, optical, and photoluminescence properties of organic/inorganic thin films. In addition, FTIR and PL spectra confirmed the miscibility/bonding of PVA polymer with CuS semiconductor material and exhibited the emission bands of the films, respectively.
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