Abstract
Electromigration and diffusion of hydrogen in palladium defected through quenching to liquid nitrogen temperature were investigated. It was found that the obtained experimental results cannot be described by means of a single flux of hydrogen which diffuses in a gradient of electric field. In order to effectively explain the obtained results, a theoretical model was elaborated. It assumed the existence of the following two fluxes of hydrogen in the quenched metal: • J i—of migration, according to the interstitial mechanism, and • J i–d—of migration, according to the interstitial-defective mechanism. Dependence of effective valences and diffusion coefficients for both mechanisms of transportation was determined in relation to the initial temperature of the quenching.
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