Abstract
The influence of composition ratio on the properties of Cu 2ZnSnS 4 thin films fabricated by co-evaporation has been investigated. From the results of X-ray diffraction analyses, the full width at half maximum of the 112 diffraction peak becomes narrower with increasing Cu/(Zn + Sn) ratio, and the normalized intensity of the 112 diffraction peak becomes stronger with approaching stoichiometry. According to the scanning electron microscope observation, the grain size becomes larger with increasing Cu/(Zn + Sn) ratio, indicating the enhancement of the grain growth under Cu-rich growth condition. The electrical properties also depend on Cu/(Zn + Sn) and Zn/Sn ratios.
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