Abstract
Chromium evaporation and oxide scale growth are two important degradation mechanisms in SOFCs when chromia-forming alloys are used as the interconnect material. In this paper the influence of temperature on both mechanisms were studied. Isothermal exposures were carried out for 24, 168 and 500h at 650, 750 and 850°C in an air-3%H2O atmosphere. In the second part uncoated and metallic nano-coated samples were exposed for 3000h. This study clearly points out the relevance of Cr-evaporation at reduced temperatures and the importance of high quality coatings not only to protect the cell from cathode poisoning but also to reduce the risk of Cr-depletion within the interconnect steel.
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