Abstract
Chromium evaporation and oxide scale growth are two important degradation mechanisms in SOFCs when chromia-forming alloys are used as the interconnect material. In this paper the influence of temperature on both mechanisms were studied. Isothermal exposures were carried out for 24, 168 and 500h at 650, 750 and 850°C in an air-3%H2O atmosphere. In the second part uncoated and metallic nano-coated samples were exposed for 3000h. This study clearly points out the relevance of Cr-evaporation at reduced temperatures and the importance of high quality coatings not only to protect the cell from cathode poisoning but also to reduce the risk of Cr-depletion within the interconnect steel.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
