Abstract
光腔衰荡方法是目前测量光学元件超高反射率（反射率>99.9%）的唯一方法。介绍了一种对光腔衰荡法中激光信号强度与时间关系的优化提取方法。设计了基于光腔衰荡法的光学元件超高反射比的测试系统，通过对采集的光腔衰荡曲线数据进行分段指数拟合，将光腔衰荡曲线数据分为5段，对每段指数拟合结果对应的<i>R</i><sup>2</sup> (R-square)和RMSE（root mean squared error）值进行对比分析，计算每段指数拟合的衰荡时间。实验结果表明：截取光腔衰荡曲线数据40%～60%部分拟合得到的结果最接近真实值，求得对应的腔镜的反射率为99.988 977%。最后通过与腔镜的自身反射率进行比较，表明该种数据拟合方法能有效地测量腔镜的反射率，并能减小实验数据本身带来的误差。
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