Abstract
ABSTRACTHigh-purity HIPed Si3N4 ceramics doped systematically with Ca additives are analyzed quantitatively by EELS. Using an ELNES related method to obtain film composition, we found that the composition difference from film to film is less significant than segregation. This is interpreted as a change of film width related to grain surface faceting. The hexagonal structure associated with anisotropie dielectric function can alter van der Waals attraction for different surface structures to produce variations in film thickness with a uniform film composition. These grain boundary films are better described as a high pressure amorphous oxynitride phase that allows higher but still limited solubility of calcium nitrogen.
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