Abstract
Using atomic force microscopy and scanning electron microscopy (SEM), we investigate the correlations between the microstructural defects and the electrical characteristics of the bicrystal grain-boundary Josephson junctions and dc superconducting quantum inference devices (SQUIDs). The structural defects are shown to correlate qualitatively with the characteristics of grain-boundary Josephson junctions patterned on the YBa2Cu3O7−x film. SEM images show that these defects grown on the grain boundary were a few submicron depth of the groove. The low flux noise characteristics were observed when the groove depth was smaller than 18nm in the junctions of the SQUID. The existence of these defects is expected to affect the supercurrent and the motion of the magnetic flux in the films, which dominate the excess noise in the SQUID with bicrystal junctions.
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