Influence of Ar, Ne, Xe, and CCl4 impurities on luminescence kinetics of Cd II ions (5s 2 2 D 5/2-5p 2 P 3/2 transition, λ = 441.6 nm) in He-Cd mixture

Abstract

The luminescence kinetics of the Cd II ion at a wavelength of 441.6 nm has been studied experi-mentally in a high-pressure He-Cd mixture in the presence of Ar, Ne, Xe, and CCl4 impurities. Cadmium ions were excited through the bombardment of a cadmium foil heated up to 240°C by a pulsed electron beam with an electron energy of 150 keV, a pulse duration of 3 ns, and a current of 500 A. The constants of collisional quenching of the Cd II 5s22D5/2 level by Ar, Ne, and Xe atoms and CCl4 molecules and the integral luminescence quenching constants of this level in the helium medium by these impurity gases have been determined. The constants of collisional quenching appeared to be 8.1 × 10−12 (Ar), 1.2 × 10−12 (Xe), 1.5 × 10−13 (Ne), and 1.8 × 10−10 cm3/s (CCl4, for λ = 325 nm), while the integral constants were found to be, respectively, 4.1 × 10−11, 3.4 × 10−11, 9.5 × 10−12, 1.4 × 10−9 cm3/s for Ar, Ne, Xe, and CCl4 at a buffer gas pressure of 1 atm.