Abstract
The α phase oriented PVDF thin films were deposited using vacuum evaporation technology with a DC electric field applied on substrate holder during deposition process. X-ray Diffraction was used to examine the structural variations as a function of applied electric fields. DSC data allowed measurement of the melting temperatures and enthalpies of the PVDF granules and films deposited at various bias voltages, providing information on the changes in the crystallinity of the films. The thermo-optical (t.o) coefficient of α phase oriented PVDF thin films with different degree of crystallinity, which obtained by regulating the applied electric voltages varying from 0 to 5KV, were determined by using spectroscopic ellipsometer (SE) equipped with a heating stage. At temperatures ranging from 20 to 100°C the refractive index of all the PVDF films was negatively correlated with the temperature between 600 and 1600nm. The value of the t.o coefficient of PVDF films was calculated at all temperatures. During the deposition process, a decrease in the degree of crystallinity was observed with the increase of applied electric voltage. Furthermore, the absolute value of t.o. coefficient for film deposited at 5kV was slightly higher and decreased with increase in the degree of its crystallinity.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
