Abstract
The annealing temperature effect on the band structure of Ba0.65Sr0.35TiO3 (BST) thin films coated on n-type Si(100) substrate was investigated by ellipsometry and x-ray photoelectron spectroscopy. The band energy shifts of sol-gel BST films annealed at different temperatures are dependent on their developed microstructure. Related to the amorphous BST films annealed at 600°C, the polycrystalline BST film annealed at 700°C exhibits narrow band gap, upwards-moved Fermi level, and downwards-moved conduction band minimum, which are believed to contribute the enhanced field emission of BST-coated Si field emitter arrays.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
