Abstract
CuInSe 2 (CIS) films have been prepared by one-step electrodeposition technique. The effect of thermal treatment in vacuum and under selenium vapour pressure on the composition and structure of CIS electrodeposited layers has been investigated. The structure and composition of these samples have been investigated by SEM, XRD, EDX and Raman spectroscopy. It was found that recrystallization of CIS thin film occurs with segregation of Cu–Se phases onto the bottom of films and formation of CIS grains different by size and composition.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
