Abstract
Thin photoactive polymer films of poly(3-octylthiophene-2,5-diyl) (P3OT) and poly(2,5-di(hexyloxy)cyanoterephthalylidene) (CN-PPV) are investigated. With X-ray reflectivity measurements, a linear concentration-thickness dependence is found for both polymers and the molecular weight of CN-PPV is determined from this concentration-thickness dependence. Based on the molecular weights, the critical blending ratio is determined. Grazing incidence wide-angle X-ray scattering (GIWAXS) is used to probe the crystallinity of thin films and to determine characteristic length scales of the crystalline structure. Moreover, the orientation of the crystalline parts regarding the substrate of both the homopolymer and the blended films is probed with GIWAXS. Temperature annealing is found to improve the crystallization for both homopolymers. In addition, reorientation of the predominant crystalline structures takes place. Blending both polymers reduces or even suppresses the crystallization during spin coating as well as temperature annealing. Absorption measurements complement the structural investigations.
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