Influence of an Immersion Gold Plating Layer on Reliability of a Lead-Free Solder Joint

Abstract

Electroless Ni/Au plating is often performed on a surface of a Cu pad to improve the wettability of lead-free solders on such a pad. Generally, electroless Au plating is performed by an immersion plating method. Since a substitution reaction of Ni and Au occurs selectively on the surface of a Ni layer in immersion plating, the Au layer does not uniformly form on the Ni layer and microvoids or microcracks easily form at the Ni/Au interface. Such defects induce void formation at the joint interface in soldering, and consequently degrade the reliability of the lead-free solder joint. In this study, the influences of immersion plating time on microvoid formation at the joint interface and the reliability of a solder ball joint with a Sn-3 mass%Ag-0.5 mass%Cu lead-free solder were investigated.