Abstract
Influence of acceptor incomplete ionization in p+ emitter on characteristics of SiC LTT with n-type blocking base was investigated in this work through TCAD simulation. The incomplete ionization model in the p+ emitter was shielded for comparison of the influence of acceptor complete ionization status. The minimum triggering intensity, forward on-state voltage drop, turn-on delay time and anode voltage falling time were simulated and discussed. The simulation results indicated that the acceptor incomplete ionization in p+ emitter makes the minimum triggering intensity, forward on-state voltage drop, switch-on delay time and anode voltage falling time increase by about 3.0 times, 1.24 times, 22% and 2.55 times, respectively.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
