Inferences of generalized inverted exponential distribution based on partially constant-stress accelerated life testing under progressive Type-II censoring

Abstract

The problem of testing the product units under stress higher than normal stress conditions is widely used in reliability analysis specially, in a high reliable products to saving time and cost which is known by accelerated life tests (ALTs) model. In this paper, we are adopted partially constant-stress ALTs model for product units have generalized inverted exponential (GIE) lifetime. And, the test is running under progressive Type-II censoring scheme. The model parameters are estimated with maximum likelihood and Bayes methods. The corresponding asymptotic confidence intervals as well as credible intervals are also constructed. The theoretical results are assessed and compared through Monte Carlo simulation study. The numerical data set is analyzed under the proposed model for illustrative purpose. Finally, we reported some comments about numerical computation.