Abstract
Several Bi-Sr-Ca-Cu-O polycrystalline thin films have been produced ex situ by sequential thermal evaporation. The relativity broad superconducting transition of these films was characterized both resistively and inductively. The maximum of the derivative of the inductive measurement curve was found, within experimental accuracy, to correspond to the resistively obtained Tc (zero). A discrepancy between the two measurement techniques was observed for the onset of the transition. The resistive van der Pauw technique indicates Tc (onset) typically above 90 K and Tc (zero) at around 79 K. On the other hand, the inductive transition starts only around 5 K above the resistively obtained Tc (zero). Percolation theory is employed in an attempt to explain these observations. In this site-percolative computer simulation, the concept of the average cluster size is modified to incorporate the effect of superconducting closed loops.
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