Abstract
Materials in the Na1−xSrx/2◻x/2NbO3 system (0.3 ≤ x ≤0.4) have been investigated by combining diffraction methods and high resolution electron microscopy with dielectric measurements. They undergo a microstructural evolution by continuously decreasing the coherent structural domain size as a consequence of the random distribution of the growing A-vacancy concentration. Change in the electrical properties occurs from the achievement of relaxor ferroelectric character in Na0.7Sr0.15NbO3 to the strongly diffuse phase transition of Na0.6Sr0.2NbO3. The nanometric size of the structural domains found in the relaxor material led us to discuss the relationship between structural domain and polar region.
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