Abstract
We observe and measure the inductance of long intrinsic Josephsonjunction arrays composed of misalignedTl2Ba2CaCu2O8 thin films grown onLaAlO3 substrates. The array consists of about 9.1×103intrinsic Josephson junctions, where 90° phase shift between acvoltage across the array and ac current flowing through has beenmeasured. Furthermore, the voltage is proportional to the frequency ofthe current. The measured inductance values of the intrinsic Josephsonjunction arrays are basically consistent with the theoreticallycalculated results, confirming that the inductance is mainly due to theJosephson effect. The dependence of the array inductance on itscritical current is also discussed.
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