Abstract
Electrical impedance tomography (EIT) is an attractive technique that aims to reconstruct the unknown electrical property in a domain from the surface electrical measurements. In this work, the induced-current learning method (ICLM) is proposed to solve nonlinear electrical impedance tomography (EIT) problems. Specifically, the cascaded end-to-end convolutional neural network (CEE-CNN) architecture is designed to implement the ICLM. The CEE-CNN greatly decreases the nonlinearities in EIT problems by designing a combined objective function and introducing multiple labels. A noticeable characteristic of the proposed CNN scheme is that the input parameters are chosen as both induced contrast current (ICC) and the updated electrical field from a spectral analysis and the output is chosen as ICC, which is fundamentally different from prevailing CNN schemes. Further, several skip connections are introduced to focus on learning only the unknown part of ICC. ICLM is verified with both numerical and experimental tests on typical EIT problems, and it is found that ICLM is able to solve typical EIT problems in less than 1 second with high image qualities. More importantly, it is also highly robust to measurement noises and modeling errors, such as inaccurate boundary data.
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