Abstract
In amorphous CoZrM (M = Zr, Nb, Ti) films the field induced uniaxial anisotropy K u varies largely as a function of the pressure of the sputter gas. An adequate thermomagnetic annealing allows to determine the respective contributions to K u of the pseudodipolar and structural anisotropy. A correlation is observed between the annealing kinetics and the local structure.
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