Abstract
AbstractSuspended particulate matter (SPM) has a complicated system of emission and transport, and a receptor model is required for apportioning the sources of SPM. We have developed a method for individual particle analysis as a method of source apportionment using electron probe microanalysis (EPMA). In this method, elemental analysis of individual SPM particles is carried out using EPMA and the emission source of each is defined according to its x‐ray spectrum. When many particles are analysed, cluster analysis is used to classify particles based on the similarity of elemental composition. If this procedure were automated it could process data more rapidly, with little work required of an analyst. In this study, we examined different kinds of cluster analyses using the data obtained from real SPM samples to increase the reliability of cluster analysis as the method of data analysis for SPM source apportionment. Copyright © 2001 John Wiley & Sons, Ltd.
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