Abstract
The magnetorefractive effect is a change in a sample’s reflectivity with applied magentic field. This is caused by the material’s index of refraction’s sensitivity to magnetic fields. However, measurements of the index of refraction as a function of applied magnetic field have not been previously published. This experimental study measures both the magnetorefractive effect and the index of refraction as a function of applied magnetic field and temperature in a 70 nm thick film of lanthanum strontium manganite La0.66Sr0.33MnO3. Index of refraction characterizations were performed with 633/nm light in magnetic fields ranging from −3 kOe to 3 kOe and near the Curie point, at temperatures from 278 K to 308 K.
Highlights
Magneto-optics represents the study of the interaction of light with magnetic fields in materials
While several papers have indicated that applied magnetic fields change the index of refraction [1,2,3,4,5], quantitative studies which state the index of refraction changes driving the magnetorefractive effect (MRE) or MT effects in the visible spectrum have not been published
This paper describes tests to measure the magnetorefractive effect and the index of refraction as a function of temperature and magnetic field for an LSMO thin film
Summary
Magneto-optics represents the study of the interaction of light with magnetic fields in materials. While several papers have indicated that applied magnetic fields change the index of refraction [1,2,3,4,5], quantitative studies which state the index of refraction changes driving the MRE or MT effects in the visible spectrum have not been published. In 2012, researchers from the Hrabovsky and Sukhorukov groups [4] studied MRE in the visible spectrum (i.e. 300 to 1300 nm) at room temperature in La1-xCrxMnO3 (x= 0.3) and La1-xAgxMnO3 (x= 0.1) samples While all of these represent significant advancements, none have reported index of refraction measurements, though they are stated to be the source of both MT and MRE [1,2,3,4,5]. Index of refraction decreased by 4.8 × 10−3 refractive index units (RIU) for an applied 3 kOe field at 290 K or a sensitivity of −1.6 mRIU/|kOe|
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