Abstract
An endurance test for a printed circuit board to ionic migration was carried out for 2000 h in a chamber controlled at 85/spl deg/C and 85%RH. The capacitance C and tan /spl delta/ between the conductors on the board were measured to find their correlation with ionic migration in the board. The measurement frequency of C and tan /spl delta/ ranged from 1 to 1000 Hz. The configuration of the test circuit was designed according to IPC-SM-840. The material of the insulating board was fiberglass-reinforced epoxy resin. The distance between the Cu conductors was 0.165 mm, and 70 V dc was applied continuously. In the low frequency region ( 30 Hz), on the other hand, gradual slight increases are observed from /spl sim/1100 h after voltage application, but no steep increases. The dependence of C and tan /spl delta/ on frequency at the measurement is due to the low mobility of Cu ions in the water film on the insulating board.
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