Abstract
The doping reaction of P in the P-doped Si growth using Si 2H 6 and PH 3 has been studied by the observation of the surface P during the growth with thermal desorption spectroscopy. When the growth temperature is set at 700°C, the surface P chemistry is strongly dependent upon the PH 3 concentration in the Si 2H 6 source. In the lower concentration below 50 ppm, the adsorbed P atoms form Si–P heterodimers, while P adsorbs on the defect site in the higher concentration region. The surface P-coverage has a linear relation with the doping concentration, which can be calculated by the two-site exchange model. The reaction scheme of the P-doped Si growth is discussed in the present paper.
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