Abstract
In this paper we present an experimental study on the effectiveness of incorporating at-speed I_DDQ testing with traditional BIST for improved test coverage. The high speed I_DDQ testing is conducted using the differential built-in on-chip current sensor (BICS) that we have recently developed. Two test chips were designed and fabricated implementing a CMOS version of the 74181 ALU chip. In copies of this circuit we included the capability of activating 45 different “realistic” CMOS faults: inter- and intra-layer shorts and opens. We examine the fault coverage of both Boolean (voltage) testing andI_DDQ testing for these realistic faults. An interesting finding of our study is that I_DDQ testing also detected several of the open faults. Moreover, these include precisely those open faults for which two pattern voltage tests can get invalidated because of transient switching states. Our results show that combining both Boolean and current testing does enhance test coverage in a BIST environment.
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