Abstract
ABSTRACTA series of laboratory modules were developed to introduce atomic force microscope (AFM) applications into undergraduate physics courses. The goal is to elucidate fundamental physics concepts at the nanoscale that will complement existing investigations at the macroscale, and to expose students to advanced instrumentation at an early level. The experiments allow students to experience the full range of scanning probe modes available, which include contact, intermittent contact, lateral force, and magnetic force microscopy as well as force distance spectroscopy. The course levels span the range from freshman introductory to advanced senior level and allow students to experience AFM applications at successive levels of complexity.
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