Abstract
We analyze the dislocation-assisted charge carrier transport and effective photocurrent generation in the photodetection devices. Specifically, the impact of screw dislocations on the performance of GaN based metal–semiconductor-metal ultraviolet photodetector is investigated. The experiments reveal that reducing screw dislocations had a strong impact on dark current (~3x decrement) of the devices as well as on the photo-generated current (~20x enhancement) upon illumination (ultraviolet, 325 nm). The responsivity of the photodetection device has been increased from 85.05 mA/W to 130.17 mA/W with decreasing dislocation density. Because, higher dislocations created leakage paths that develop trap states which enhances the possibility of recombination process of photo-generated electron-hole pairs leading to lower charge collection. Further, the external quantum efficiency increases from 32.51% to 49.76% by reducing dislocation density. The work in this study proposes that reduction of defects/dislocations will be an effective approach to enrich the III-nitride semiconductor system for advancement in optoelectronic devices.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
