Abstract

Metal halide perovskite single crystals are a promising candidate for X-ray detection due to their large atomic number and high carrier mobility and lifetime. However, it is still challenging to grow large-area and thin single crystals directly onto substrates to meet real-world applications. In this work, millimeter-thick and inch-sized methylammonium lead tribromide (MAPbBr3) single-crystal wafers are grown directly on indium tin oxide (ITO) substrates through controlling the distance between solution surface and substrates. The single-crystal wafers are polished and treated with O3 to achieve smooth surface, lower trap density, and better electrical properties. X-ray detectors with a high sensitivity of 632 µC Gyair −1 cm−2 under –5 V and 525 µC Gyair −1 cm−2 under –1 V bias can be achieved. This work provides an effective way to fabricate substrate-integrated, large-area, and thickness-controlled perovskite single-crystal X-ray detectors, which is instructive for developing imaging application based on perovskite single crystals.

Highlights

  • In recent years, metal halide perovskite (MHP) materials have been demonstrated as promising candidates for sensitive X-ray detections due to their superior properties (Li Z et al, 2021), such as large atomic number, high carrier mobility and lifetime, and low-defect density (Wei et al, 2017; Cheng et al, 2019; Chen et al, 2019)

  • We report sensitive X-ray detectors made of millimeter-thick and inch-sized MAPbBr3 single-crystal wafers

  • Synthesis of Methylammonium Bromide (CH3NH3Br): CH3NH3Br was synthesized on the basis of the previously reported method in which hydrobromic acid (HBr) and CH3NH2 were reacted with the molar ratio of 1:1.2

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Summary

Introduction

Metal halide perovskite (MHP) materials have been demonstrated as promising candidates for sensitive X-ray detections due to their superior properties (Li Z et al, 2021), such as large atomic number, high carrier mobility and lifetime, and low-defect density (Wei et al, 2017; Cheng et al, 2019; Chen et al, 2019). There are two kinds of perovskite X-ray detectors: direct and indirect detection modes (Zhou et al, 2020). Compared to indirect detection which converts X-ray to a light signal, the direct detection mode which converts X-ray to an electrical signal has larger spatial resolution and higher sensitivity (Basiricò et al, 2019). Α-Se detectors have low sensitivity and require high dose for imaging, which brings cancer risk to the patients (Kasap et al, 2000). The sensitivity of perovskite X-ray detectors are several orders of magnitude larger than that of commercial α-Se detectors, especially for hard X-ray (Wang et al, 2020; Deumel et al, 2021; Liu et al, 2021a; Peng et al, 2021)

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