Abstract
Summary Ion migration in perovskite materials accelerates its decomposition—deteriorating device performance, causing baseline drift, and lowering imaging resolution. In particular, in X-ray detectors, the effect of ion migration is more obvious under the necessary high working bias. Here, we report an effective strategy to grow superior inch-sized, high-quality, zero-dimensional (0D)-structured, lead-free (CH3NH3)3Bi2I9 perovskite single crystals. These crystals have significantly lower ion migration, reduced dark current, and better environmental stability compared with other perovskites, enabling us to fabricate a type of 0D-structured perovskite X-ray detector. The X-ray detector shows high sensitivity of 1,947 μC Gyair−1 cm−2, low detection limit of 83 nGyair s−1, short response time of 23.3 ms, the lowest baseline drift of 5.0 × 10−10 nA cm−1 s−1 V−1, and the best long-term stability among all perovskites reported. The combination of large crystal size and excellent X-ray response allows us to fabricate the first 0D-structured perovskite X-ray imaging system.
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