Abstract
The most important characteristics of the MOS transistor operating in weak inversion are discussed. When the drain voltage is greater than a few kT/q it is demonstrated that the drain current can be written as the product of the geometrical factor W/L , the minority carrier diffusion constant, and the inversion charge at the source. In the classical theory, the slope of the In I D versus V G curve is only influenced by the capture of minority carriers by surface states. It is demonstrated that the N ss values obtained from these current measurements are in disagreement with the values found by independent surface states measuring techniques.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.