Abstract

The measurement of diffraction data from macromolecular crystal samples held in vacuo holds the promise of a very low X-ray background and zero absorption of incident and scattered beams, leading to better data and the potential for accessing very long X-ray wavelengths (>3 Å) for native sulfur phasing. Maintaining the hydration of protein crystals under vacuum is achieved by the use of liquid jets, as with serial data collection at free-electron lasers, or is side-stepped by cryocooling the samples, as implemented at new synchrotron beamlines. Graphene has been shown to protect crystals from dehydration by creating an extremely thin layer that is impermeable to any exchanges with the environment. Furthermore, owing to its hydrophobicity, most of the aqueous solution surrounding the crystal is excluded during sample preparation, thus eliminating most of the background caused by liquid. Here, it is shown that high-quality data can be recorded at room temperature from graphene-wrapped protein crystals in a rough vacuum. Furthermore, it was observed that graphene protects crystals exposed to different relative humidities and a chemically harsh environment.

Highlights

  • Third-generation synchrotron sources have created new opportunities for the measurement of macromolecular crystallography (MX) diffraction data on ever more challenging structural targets, yielding much smaller and weakly diffracting crystals

  • From these diffraction images there is a slight degradation in the diffracting power of the crystals wrapped in graphene/PMMA placed under vacuum, but no degradation in the quality of the reflections

  • The diffraction quality drops off much more quickly in these crystals, with limited diffraction being visible in the last image of the data collection when compared with the same image for those crystals protected by graphene/PMMA

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Summary

Introduction

Third-generation synchrotron sources have created new opportunities for the measurement of macromolecular crystallography (MX) diffraction data on ever more challenging structural targets, yielding much smaller and weakly diffracting crystals. This is owing to developments in beamline instrumentation, such as pixel-array detector (PAD) technology (Mueller et al, 2012), improved quality of focusing optics (Duke & Johnson, 2010) and higher brightness sources with greater stability. The diffraction intensity decreases proportionally and sources of X-ray background other than the crystal can bury the signal. Instrument-generated scatter from slits, apertures or optics may add to the background noise observed at the detector

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