Abstract
We directly observed the gradual thinning and eventual failure of single-crystalline gold (Au) contacts under increasing electric bias. The contacts fractured in a controlled manner at a current density of around (2--3) \ifmmode\times\else\texttimes\fi{} 10${}^{10}$ A/cm${}^{2}$, so that nanogaps 1--2 nm wide were formed reproducibly. Also, the surface migration of Au atoms was observed to be enhanced by stretching the contact, suggesting that the surface migration of the Au atoms was sensitive to the stress distribution. The Au contact is probably fractured in a controlled manner, when it becomes stress free.
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