Abstract
Abstract This paper addresses the in-situ measurement of various properties of curing systems with a particular dielectric method called Microdielectrometry. We have used integrated circuit technology to develop a miniaturized dielectric probe that combines small size with built-in amplification to achieve sensitivity at frequencies as low as 1 Hz. The device combines a planar interdigitated electrode structure with a pair of matched field-effect transistors. Calibration is based entirely on the details of the electrode geometry, and thus is stable with respect to temperature variations, and is reproducible from device to device. Generally, what is measured is the frequency dependent dielectric permittivity (ϵ) and dielectric loss factor (ϵ) in the frequency range 1–1000 Hz. In this paper, the results of isothermal cures of the amine-epoxy system DGEBA-MPDA are presented, and are shown to provide a measurement of a low-frequency dielectric relaxation time which can be correlated with bulk viscosity prior ...
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