Abstract
Composite structures consisting of (001)-oriented SrTiO3 (STO)/La0.7Sr0.3MnO3 (LSMO) films of 30 nm thickness, grown on an (001) Pb(Mg1/3Nb2/3)TiO3– 28 mol.% PbTiO3 piezoelectric relaxor-ferroelectric single-crystalline wafer were investigated by means of Wide-Angle X-ray Diffraction (WAXRD) in situ under influence of a d.c. electric field with strength E up to ±18 kV/cm. The WAXRD measurements of the films and substrate reflection profiles resulted in a determination of the strain s in the films and the substrate separately. The strained state of the STO/LSMO films is effectively controlled by a huge converse piezoelectric effect of the PMN-PT substrate. The coefficients of coupling between electric-field-induced out-of-plane strain in the films and in the substrate for the composite system STO/LSMO/PMN-PT are obtained.
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