Abstract
In situ X-ray photoelectron spectra (XPS) of metal–octaethylporphyrin [Pd(OEP), Cu(OEP), and Zn(OEP)] and C60 alternative-deposited films on a silicon substrate are presented for the fabrication of high-performance organic thin-film photovoltaic (PV) cells. XPS results indicated that only Zn(OEP) and C60 alternative-deposited films have a layered structure, whereas the other films have a mixed structure. This may be due to the difference in molecular symmetry between the anti- and syn-configurations of M(OEP): Zn(OEP) has a syn-configuration that can be stacked on a C60 film, whereas the other M(OEP)s have an anti-configuration that is difficult to be stacked on the film.
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