Abstract
X-ray absorption spectroscopy (XAS) is one of the important technique to investigate the oxidation states, electronic structure, and local atomic structure, which are crucial parameters in ferroelectric ceramics. In this work, in-situ XAS and x-ray diffraction (XRD) techniques were employed to investigate the field-induced ferroelectric domain switching and Ti off-center displacement in Ba0·85Ca0·15Zr0·1Ti0·9O3 ceramics. Ferroelectric BCZT ceramics possess an excellent ferroelectric property, but their mechanism of field-induced ferroelectricity is still unclear. The present work demonstrates that in-situ XAS can be applied to quantify field induced octahedral distortion (Ti off-center displacement) and provide a better understanding of the origin of ferroelectric properties in BCZT ceramics.
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