In Situ transmission Electron Microscope Observation of Biased-Induced Dynamic Evolution of Two-Dimensional CrS2

Abstract

Two-Dimensional transition-metal dichalcogenides (2D-TMDs) have attracted great attention recently owing to their potential to become the important material for next generation semiconductor devices. While using the device, it needs to ensure high density current and biased voltage for a long time. However, the study on TMDs in high-energy environment is insufficient. In this work, the phase evolution of CrS2 are revealed via in-situ biasing experiments and recorded by transmission electron microscope (TEM) at atomic scale. The ultra-thin layered (~1.6nm) CrS2 was synthesized through atmospheric pressure chemical vapor deposition (APCVD), followed by transferring the as-grown samples onto specialized TEM electrical chips. The TEM characterization of CrS2 initial sample provided the basic understanding of this Cr-based TMD, identified as pure 1T phase with single crystal structure as shown in Figure 1. The advanced in situ technique was employed to record the structural evolution and was tested the endurance of CrS2 during biasing. Moreover, the results can make significant contributions to future semiconductor device designs and demonstrate CrS2 has great potential as a semiconductor device with its outstanding characteristic of biased-endurance. Figure1. (a) Low-magnification TEM image of 1T-CrS2. (b) High-resolution TEM image of 1T-CrS2, corresponding with FFT along [001] zone axis. (c) AFM image of the as-grown CrS2 sample, blue bar in the image is X axis of (d). (d) AFM height profile of as-grown 1T-CrS2 with average thickness of~1.6nm. (e) STEM image of 1T-CrS2 and shows d-spacing~0.336 nm. (f) Low-magnification TEM image of the device, showing that the transferred CrS2 layer was suspended on the membrane with Au electrodes on both sides. (g,h) In-situ TEM observation of the biasing experiment after 5V biasing for 5 min of 1T-CrS2. Time-sequencing TEM images showing the structural evolution of biasing. The inset shows the corresponding FFT-DP to reveal the variation of crystallinity of the sample. (g) Initial structure of 1T-CrS2. (h) 1T-CrS2 under in-situ biasing experiment after 10 minutes. Figure 1