Abstract
Contact resistance between a multiwalled carbon nanotube (MWNT) and a metal electrode is governed by the contact structure. The relationship between the contact structure and electrical resistance was examined by in situ transmission electron microscopy using a nickel electrode and MWNTs with two kinds of tip structure; close‐capped and open‐ended. When the current density through the contact region reached a threshold value about 7.6 × 108 A/cm2, the MWNT tip was embedded below the nickel surface by local melting of the metal, and the contact resistance was reduced. In the case of the open‐ended MWNT, significant reduction of the contact resistance was observed, because inner shells of the MWNT with open cap can connect directly with the electrode. Copyright © 2011 John Wiley & Sons, Ltd.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
