Abstract
ABSTRACTCu/Ni (001) multilayers have been grown by molecular beam epitaxy at room temperature. In-situ electron diffraction and curvature measurements performed during the growth are presented. The average lattice parameter in the equiatomic multilayers evolves gradually towards the alloy lattice parameter. The in-plane lattice parameter of both Cu and Ni evolves continuously towards the bulk lattice parameter with no evidence of pseudomorphic growth. The combination of diffraction and curvature measurements suggests that the Ni on Cu interface is diffuse. This is attributed to the surfactant behaviour of Cu. This results shed new insights into the interesting magnetic properties of Ni films on Cu (001).
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