Abstract
We have developed a LA-ICP-MS technique for the in situ determination of 87Sr/86Sr in silicates having low Sr concentrations (30–400 µg g−1). Because of its high sensitivity we used a single collector sector-field ICP-MS, which was combined with a 193 nm Nd:YAG laser ablation system. Experiments were performed using the fast electrical scan mode (0.1 s per pass) of the mass spectrometer and a spot size of 50 µm. Various corrections were made for the determination of 87Sr/86Sr, such as dead time of the ion counting system, blank, isobaric interferences of Kr and Rb, mass discrimination for Sr and Rb. An external precision (1 SD) of the Sr isotope measurements of about 0.0002–0.0004 were achieved for samples having Sr of 100–400 µg g−1 and Rb/Sr < 0.1. Lower Sr concentrations (30–100 µg g−1) yielded higher SD values of up to about 0.0015. The LA-ICP-MS data for MPI-DING, USGS and NIST reference glasses agree within uncertainty limits with high-precision TIMS values. We have applied this technique for in situ isotopic analysis of 100–300 µm glassy melt inclusions from Hawaii and of small glass fragments of oceanic basalts.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
