Abstract
An efficient and accurate algorithm for determining the magnitude of noise as a function of signal in an arbitrary digital image is presented and demonstrated. The algorithm is robust and largely independent of the form of the image, returning the noise function with subcount error across the full dynamic range of a synthetic test image where noise of a known form has been added. The noise performance of a CCD under different image recording and processing conditions is examined using the algorithm. The effect of different noise functions on pattern-matching measurements of electronic structure by quantitative convergent beam electron diffraction is investigated.
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