Abstract
Eutectic growth of Ni-Si alloy with a composition of Ni44Si56 was observed in situ during directional solidification. Lamellar structure was evident behind the solidifying interface, which indicates that the two intermetallic phases, NiSi and NiSi2, generated a regular eutectic. The lamellae spacing was approximately 9.8 μm at a growth rate of 149.6 μm s−1. The phase boundaries migrated rapidly during the cooling stage and the lamellae enlarged significantly, which suggests that the lamellae spacing measured after the solidification may not be accurate for obtaining the relationship between the growth rate and the lamellae spacing. The in situ observation provides a promising way to obtain the exact eutectic spacing of Ni-Si eutectics.
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