Abstract
In-situ monitoring of pesticide residues during crop growth or/and in related products is of great significance in avoiding the abuse of pesticides but remains challenging thus far. In this report, we proposed a background-free surface-enhanced Raman spectroscopy (bf-SERS) platform to non-destructively track the nitrile-bearing pesticide residues in soybean leaves with high sensitivity and selectivity. The outstanding feature of the assay stems from the dramatic Raman enhancement effect of the 50 nm-sized gold nanoparticles (AuNPs) towards the pesticides and simultaneously the background-free Raman signal of the nitrile group in the so-called Raman-silent region (1800–2800 cm‒1). This bf-SERS assay was applied to evaluate the penetration effects of nitrile-bearing pesticides and monitor their residues in soybean leaves after rinsing with various solutions, providing a reliable tool for guiding the safe use of nitrile-bearing pesticides in agriculture.
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