Abstract
In this paper, we report the successful combination of macroscopic uniaxial tensile testing of bulk specimen combined with In situ dislocation-scale observations of the evolution of deformation microstructures during loading at several stress states. The dislocation-scale observations were performed by Accurate Electron Channeling Contrast Imaging in order to follow the defects evolution and their interactions with grain boundaries for several regions of interest during macroscopic loading. With this novel in situ procedure, the slip systems governing the deformation in polycrystalline bulk β-Ti21S are tracked during the macroscopic uniaxial tensile test. For instance, curved slip lines that are associated with “pencil glide” phenomenon and tangled dislocation networks are evidenced.
Highlights
Developing innovative techniques that allow for understanding and predicting the mechanical properties of materials has become a necessity for the Materials Science community, in order to follow the fast evolution of the industrial demands [1,2,3]
Various approaches of mechanical testing inside a Transmission Electron Microscope (TEM) exist: using TEM holders with a simple mechanical actuation [11] or elaborating testing-units that fit inside the pole pieces [12,13]
Bulk tensile samples were cut from a 1.78 mm thickness rolled sheet of β-Ti21S alloy, which were produced by Titanium Metals Corporation (Toronto, ON, Canada)
Summary
Developing innovative techniques that allow for understanding and predicting the mechanical properties of materials has become a necessity for the Materials Science community, in order to follow the fast evolution of the industrial demands [1,2,3].Generally, mechanical testing is preceded and/or followed by microstructural investigations in order to get the structure-property-processing relationships [4,5,6,7]. Developing innovative techniques that allow for understanding and predicting the mechanical properties of materials has become a necessity for the Materials Science community, in order to follow the fast evolution of the industrial demands [1,2,3]. In situ characterization provides more useful data for a more realistic theoretical modeling, which allows for predicting the mechanical performance of components. In situ mechanical testing in Transmission Electron Microscope (TEM) [8,9,10] is well known for studying the evolution of crystalline defects under stress. While TEM allows reaching the highest-resolution data, In situ TEM mechanical testing is experimentally difficult and it does not necessarily reflect the macroscopic response of a material. TEM needs an electron transparent specimen with a thickness of ≈ 100 nm with a useful field of view of few μm
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
