Abstract
Journal Article In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging Get access Mikhail Dutka, Mikhail Dutka Thermo Fisher Scientific, Achtseweg Noord 5, 5651 GG Eindhoven, Netherlands Search for other works by this author on: Oxford Academic Google Scholar Romaine Isaacs, Romaine Isaacs Thermo Fisher Scientific, Vlastimila Pecha 12, 627 00 Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Anna Prokhodtseva, Anna Prokhodtseva Thermo Fisher Scientific, Achtseweg Noord 5, 5651 GG Eindhoven, Netherlands Search for other works by this author on: Oxford Academic Google Scholar Tomáš Vystavěl Tomáš Vystavěl Thermo Fisher Scientific, Vlastimila Pecha 12, 627 00 Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 548–549, https://doi.org/10.1017/S1431927619003477 Published: 01 August 2019
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
