Abstract
The dynamic transmission electron microscope (DTEM) is introduced as a novel tool for in situ nanowire (NW) synthesis and characterization. Initial results show crystalline Si NW production by a root-based growth mechanism using a pulsed laser ablation (PLA) method inside the microscope column (see image). The potential of the DTEM to characterize the evolution of nanostructures by PLA methods is demonstrated.
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