Abstract
We developed a Kerr microscope designed as a simple add-on device to an existing vacuum chamber with sufficient sensitivity to permit in situ domain imaging for magnetic films grown in an ultrahigh vacuum environment. The performance of this microscope will be demonstrated by domain images obtained on Fe films deposited on Cu(001) and W(011). For systems with perpendicular magnetization sufficient signal/noise ratio (5) and 10 μm resolution can be obtained with single exposures as short as 0.7 s. This permits simultaneous acquisition of spatially resolved magnetometry data. Image averaging is used when the magnetization is in-plane. Monolayer sensitivity can be obtained in both cases. Examples of domain nucleation and wall propagation in several layer thick Fe/Cu(001) films will be given together with the estimation of their Barkhausen length. Wedge configuration was used to image magnetic behavior in the vicinity of the spin–reorientation transition. Preliminary data for domain wall behavior in 4 monolayer Fe/W(001) film with strong uniaxial in-plane anisotropy will also be presented.
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